나노재료의 정량적 구조분석
TEM electron crystallography
TEM precession diffraction
EBSD-TEM
Microscopy Conference 2009
2009-06-25
Gordon Research Conferences
2009-06-25
NANO Korea 2009
2009-06-25
25th European Crystallographic Meeting
2009-06-25
Microscopy & Microanalysis 2009 Meeting
2009-06-25
나노프로브
Nano Probe Workstation
in SEM FIB
시편의 전기적, 역학적 특성 측정
